Tessent TestKompress
Learn how Tessent TestKompress achieves the highest quality embedded deterministic scan test with the lowest manufacturing test cost.
Tessent TestKompress
Overview
Key Features
Industry-Leading Scan Test Tool
Tessent TestKompress uses Embedded Deterministic Test technology to achieve the highest level of test quality while compressing scan patterns often 100X or more.
QUALITY
Highest Defect Coverage
Tessent TestKompress supports all traditional fault models used for uncovering both static and dynamically activated defects. Support for user-defined fault models (UDFM) also allows virtually any defect mechanism to be modeled and targeted.
PRODUCTIVITY
Fully Automated
Tessent TestKompress is built on the Tessent Connect end-to-end automation platform, which offers comprehensive automation, TCL-based scripting, and introspection capabilities. To maximize throughput, automatic test pattern generation (ATPG) can be distributed across multiple processors.
EFFICIENCY
Lower Test Time and Pattern Count
Built on the patented Embedded Deterministic Test (EDT) technology, Tessent TestKompress reduces both test time and pattern volume by several orders of magnitude without any loss in fault coverage.
