Tessent TestKompress

Learn how Tessent TestKompress achieves the highest quality embedded deterministic scan test with the lowest manufacturing test cost.

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Key Features

Industry-Leading Scan Test Tool

Tessent TestKompress uses Embedded Deterministic Test technology to achieve the highest level of test quality while compressing scan patterns often 100X or more.


Highest Defect Coverage

Tessent TestKompress supports all traditional fault models used for uncovering both static and dynamically activated defects. Support for user-defined fault models (UDFM) also allows virtually any defect mechanism to be modeled and targeted.

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fully automated

Fully Automated

Tessent TestKompress is built on the Tessent Connect end-to-end automation platform, which offers comprehensive automation, TCL-based scripting, and introspection capabilities. To maximize throughput, automatic test pattern generation (ATPG) can be distributed across multiple processors.


Lower Test Time and Pattern Count

Built on the patented Embedded Deterministic Test (EDT) technology, Tessent TestKompress reduces both test time and pattern volume by several orders of magnitude without any loss in fault coverage.

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